Wels CampusEngineering

BRUKER D8 ADVANCE - X-ray diffraktometer

With the XRD it is possible to record diffractograms (or diffraction diagrams). X-ray diffraction is one of the most important non-destructive analysis methods to detect the chemical composition of crystalline materials and to determine crystal parameters (e.g. lattice distances, residual stresses) and amounts (e.g. retained austenite determination). The lattice parameters of a crystal system can be determined from the diffraction angles of the X-ray diffraction and the wavelength of the X-ray radiation used. The diffractograms are analysed using a database in which more than 100000 crystal systems are stored.

Technical Data

  • Configuration: Theta/2 Theta
  • Measuring circle diameter: 435, 500, 600mm
  • Smallest addressable increment: 0.0001°
  • Angle positioning: stepper motors with optical encoders
  • Max. angular speed: 1500°/min
  • X-ray sources: molybdenum and copper